Lithuanian Researchers Boost Atomic Force Microscopy with Faster, Wider Scanning
Scientists in Lithuania have developed a breakthrough method that dramatically speeds up atomic force microscopy (AFM) and expands its scanning range to the millimetre scale. Developed by researchers at Vilnius University (VU) and the Center for Physical Sciences and Technology, this innovation, featured in the journal “Measurement”, marks a significant advancement in nanoscale imaging, with potential applications across materials science, biotechnology, and semiconductor research.